Investigation of the electrical properties of metal chalcogenide thin films: A review

Ho, Soon Min (2016) Investigation of the electrical properties of metal chalcogenide thin films: A review. Der Pharma Chemica, 8 (11). pp. 17-20. ISSN 0975-413X

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Abstract

In the present study, thin films have been successfully prepared by using various deposition methods. The electrical behaviors of obtained thin films were investigated by using Hall Effect measurement and Van Der Pauw technique as reported by many researchers. The experiment results show that the electrical resistivity reduces with increase in temperature and film thickness as well.

Item Type: Article
Additional Information: Scopus ID: 56701569600
Uncontrolled Keywords: Electrical properties, film thickness, resistivity, deposition
Subjects: T Technology > TA Engineering (General). Civil engineering (General)
Divisions: Faculty of Engineering, Science and Mathematics > School of Engineering and Quantity Surveying
Depositing User: Unnamed user with email masilah.mansor@newinti.edu.my
Date Deposited: 12 Aug 2016 06:47
Last Modified: 24 Nov 2016 08:11
URI: http://eprints.intimal.edu.my/id/eprint/489

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