Ho, Soon Min (2016) Atomic Force Microscopy Studies on the Surface Morphologies of Chemical Bath Deposited CuS Thin Films. Oriental Journal of Chemistry, 32 (3). pp. 1515-1519. ISSN 0970-020 X
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Atomic Force Microscopy Studies on the Surface Morphologies of Chemical Bath Deposited CuS Thin Films.pdf - Published Version Download (1MB) | Preview |
Abstract
In this work, copper sulphide thin films were deposited onto microscope glass slide by chemical bath deposition technique. The tartaric acid was served as complexing agent to chelate with Cu2+ to obtain complex solution. The influence of pH value on the surface morphologies of the films has been particularly investigated using the atomic force microscopy technique. The atomic force microscopy results indicate that the CuS films deposited at pH 1 were uniform, compact and pinhole free. However, the incomplete surface coverage observed for the films prepared at high pH (pH 2 and 2.5) values.
| Item Type: | Article |
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| Additional Information: | Scopus ID: 56701569600 |
| Uncontrolled Keywords: | Chemical bath deposition, Atomic force microscopy, Thin films, film thickness, surface roughness, copper sulphide |
| Subjects: | T Technology > TA Engineering (General). Civil engineering (General) |
| Divisions: | Faculty of Engineering, Science and Mathematics > School of Engineering and Quantity Surveying |
| Depositing User: | Unnamed user with email masilah.mansor@newinti.edu.my |
| Date Deposited: | 11 Aug 2016 08:09 |
| Last Modified: | 24 Nov 2016 08:02 |
| URI: | http://eprints.intimal.edu.my/id/eprint/486 |
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