Ho, Soon Min (2016) Chemical bath deposited copper tin sulphide thin films: SEM and EDX analysis. Journal of Applied Sciences Research, 12 (2). pp. 12-15. ISSN 1816-157X
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Abstract
In this work, the scanning electron microscopy (SEM) and energy dispersive x-ray analysis (EDX) results on the chemical bath deposited copper tin sulphide thin films were presented. Thin films were deposited on the indium tin oxide (ITO) glass substrates from aqueous solutions. The influence of the various deposition times on the morphology and the composition of the obtained films were analyzed using SEM and EDX, respectively
| Item Type: | Article |
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| Additional Information: | Scopus ID: 56701569600 |
| Uncontrolled Keywords: | Thin films, chemical bath deposition, scanning electron microscopy, Energy dispersive X-ray analysis, solar cell |
| Subjects: | T Technology > TA Engineering (General). Civil engineering (General) |
| Divisions: | Faculty of Engineering, Science and Mathematics > School of Engineering and Quantity Surveying |
| Depositing User: | Unnamed user with email masilah.mansor@newinti.edu.my |
| Date Deposited: | 11 Aug 2016 03:22 |
| Last Modified: | 24 Nov 2016 08:10 |
| URI: | http://eprints.intimal.edu.my/id/eprint/477 |
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