Sanchez, Harold and Cioffi, Jorge and Ventura, Rodrigo and Ferreira, Vitor and Ramos, Rodrigo and Martinez, Alexander and Montaluisa, Julio and Gonzalez, Julio and Postigo, Henry and Hamilton, Francis and Elmquist, Rand and Zhang, Nien Fan and Izquierdo, Daniel (2014) Final Report SIM.EM-S5 Voltage, Current and Resistance Comparison June 2007-October 2009. Metrologia, 51. ISSN 1681-7575
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Abstract
This is a report of the results of the second Interamerican Metrology System (SIM) comparison on calibration of digital multimeters, performed for strengthening the interaction among National Metrology Institutes (NMIs) and for establishing the degree of equivalence between those laboratories in accordance with the CIPM Mutual Recognition Agreement. From June 2007 to October 2009, four multimeters were used as traveling standards for measurements in eleven countries, with NIST-USA acting as pilot laboratory. Results for nine measurement points are presented as errors relative to a comparison reference value together with their uncertainty.
| Item Type: | Article |
|---|---|
| Uncontrolled Keywords: | Comparison, multimeter, measurement error, measurement uncertainty |
| Subjects: | T Technology > TK Electrical engineering. Electronics Nuclear engineering |
| Divisions: | Faculty of Engineering, Science and Mathematics > School of Engineering and Quantity Surveying |
| Depositing User: | Unnamed user with email masilah.mansor@newinti.edu.my |
| Date Deposited: | 20 Jun 2016 05:30 |
| Last Modified: | 05 Oct 2016 02:10 |
| URI: | http://eprints.intimal.edu.my/id/eprint/345 |
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