Items where Author is "Wen, Zheng"

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Wen, Zheng and Wai Yie, Leong (2025) Conducted Electromagnetic Susceptibility Analysis of Chips Based on BCI Method. INTI JOURNAL, 2025 (23). pp. 1-7. ISSN e2600-7320

Wen, Zheng and Leong, Wai Yie (2025) A Review of Electromagnetic Safety Protection Technologies. INTI JOURNAL, 2025 (27). pp. 1-9. ISSN e2600-7320

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