Ion beam features produced by two plasma focus machines operated with different gases

Akel, M. and Salo, Sami Alsheikh and Saw, S. H. and Lee, S. (2014) Ion beam features produced by two plasma focus machines operated with different gases. IEEE Transactions on Plasma Science, 42 (9). 2202 -2206. ISSN 0093-3813

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Ion beams emitted from the low-inductance kJ NX2 plasma focus have been numerically characterized and trends of these beams in various gases have been reported. In this paper, the ion beams from high-inductance kJ plasma focus machines AECS PF2 and INTI operated with various gases are studied. The obtained results show that the beam ions mean energy depends on the gas type and increases with increasing ion mass of the gas. It also indicates a higher ion fluence for H 2 (4.4 × 10 20 ions m −2 ), and a very small fluence value for Xe (0.085 × 10 20 ions m −2 ). The ion number reduces from H 2 (24 × 10 14 ) to Xe (0.074 × 10 14 ). The ion current decreases from H 2 (20.5% of the discharge current) to 5.4% for Xe. The beam energy drops from H 2 (0.63% of stored energy E 0 ) to 0.4% for O 2 ; however, then increases from Ne to the radiatively-collapsed gases Ar, Kr, and Xe. Argon has the highest damage factor (77 × 10 10 Wm −2 s 0.5 ), while the lightest gases have the lowest (2–6 × 10 10 Wm −2 s 0.5 ). The magnetic field compressing the pinch is higher for the heavier gases. This paper confirms that the trends of ion beam production with various gases in high- inductance machines are the same as the trends in low-inductance machines.

Item Type: Article
Uncontrolled Keywords: Different gases, ion beam, Lee model, plasma focus.
Subjects: Q Science > QC Physics
Divisions: Centre for Plasma Research
Depositing User: Unnamed user with email
Date Deposited: 20 Jan 2016 02:51
Last Modified: 05 Sep 2017 08:36

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