Ho, Soon Min (2016) A scanning electron microscopy investigation of semiconductor metal chalcogenide thin films: A review. Der Pharma Chemica, 8 (2). pp. 13-16. ISSN 0975-413X
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Official URL: http://derpharmachemica.com/2016-vol-8-issue-2.htm...
Abstract
Nowadays, scanning electron microscopy is a valuable tool that could be applied in a number of applications including forensic sciences, metallurgy and nanotechnologies. In view of researchers, it provides a better overall visual image of the sample and makes the quick resolution of tough analytical problems effectively. In this work, the characterization of thin films prepared under various deposition conditions by using scanning electron microscopy was discussed and reported.
| Item Type: | Article |
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| Additional Information: | Scopus ID: 56701569600 |
| Uncontrolled Keywords: | Scanning electron microscopy, thin films, grain size, deposition method. |
| Subjects: | T Technology > TA Engineering (General). Civil engineering (General) |
| Divisions: | Faculty of Engineering, Science and Mathematics > School of Engineering and Quantity Surveying |
| Depositing User: | Unnamed user with email masilah.mansor@newinti.edu.my |
| Date Deposited: | 11 Aug 2016 05:46 |
| Last Modified: | 24 Nov 2016 08:31 |
| URI: | http://eprints.intimal.edu.my/id/eprint/480 |
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