Ho, Soon Min (2016) Application of energy dispersive X-ray analysis technique in chalcogenide metal thin films: Review. Middle-East Journal of Scientific Research, 24 (2). pp. 445-449. ISSN 1990-9233
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Application of energy dispersive X-ray analysis technique in chalcogenide metal thin films_Review.pdf - Published Version Download (219kB) | Preview |
Abstract
Thin films have been synthesized in the presence of different precursors using various deposition methods such as chemical bath deposition, electrodeposition and successive ionic layer adsorption and reaction. The obtained thin films could be investigated using energy dispersive X-ray (EDX) technique in terms of compositional characterization. Generally, EDX analyzer was equipped with the scanning electron microscopy as described by many researchers. In this work, the EDX analysis has been carried out in order to improved quality control and rapid identification of source.
| Item Type: | Article |
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| Additional Information: | Scopus ID: 56701569600 |
| Uncontrolled Keywords: | Compositional analysis Atomic percentage Energy dispersive x-ray technique Thin films Scanning electron microscopy |
| Subjects: | T Technology > TA Engineering (General). Civil engineering (General) |
| Divisions: | Faculty of Engineering, Science and Mathematics > School of Engineering and Quantity Surveying |
| Depositing User: | Unnamed user with email masilah.mansor@newinti.edu.my |
| Date Deposited: | 11 Aug 2016 03:26 |
| Last Modified: | 24 Nov 2016 08:02 |
| URI: | http://eprints.intimal.edu.my/id/eprint/478 |
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