Gautam, P. and Khanal, R. and Saw, S. H. and Lee, S. (2015) Comparison of Measured Soft X-Ray Yield Versus Pressure for NX1 and NX2 Plasma Focus Devices Against Computed Values Using Lee Model Code. Journal of Fusion Energy, 34 (3). pp. 686-693. ISSN 1572-9591
Full text not available from this repository.Abstract
The soft X-ray yield versus pressure curves of NX1 and NX2 plasma focus machines have been measured and published for different pressures and electrode configurations. In this work, the numerical experiments are carried out, using Lee model code. The Lee model code is configured for each of these devices NX1 and NX2 by fitting computed total discharge current waveform against a measured total discharge current waveform. The computed soft X-ray yield versus pressure curves are compared with the laboratory measured soft X-ray yield versus pressure data. The comparison shows agreement between computation and measurement of several important features of the yield versus pressure curves.
| Item Type: | Article |
|---|---|
| Uncontrolled Keywords: | Plasma focusSoft X-rayLee model codeDischarge current |
| Subjects: | Q Science > QC Physics |
| Divisions: | Centre for Plasma Research |
| Depositing User: | Unnamed user with email masilah.mansor@newinti.edu.my |
| Date Deposited: | 11 Jan 2016 01:10 |
| Last Modified: | 09 Sep 2016 07:19 |
| URI: | http://eprints.intimal.edu.my/id/eprint/14 |
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