Plasma Platform to Investigate Error Structure in the Electronic Components

M.V., Roshan and H., Sadeghi and S., Fazelpour and Lee, S. and Yap, S. L. (2019) Plasma Platform to Investigate Error Structure in the Electronic Components. IEEE Transactions on Plasma Science, 47 (5). pp. 2609-2614. ISSN 0093-3813

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This program was designed to introduce a plasma platform to examine the field programmable gate array (FPGA) of the link boards typically used at the CERN's Large Hadron Collider (LHC). Pulsed plasma systems with accelerating gradient of 1 kV/μm generate high-intensity, high-energy radiation beams. Single-event upset (SEU) is caused by radiation deposition in the FPGA. In FPGA, the SEU probability for 1-MeV protons and 10-keV X-rays are 0.1 and 2×10 -9 particle -1 . The number of SEU induced in the Si by 1-MeV proton irradiation at 0.8-V bias computed from simulation in COMSOL Multiphysics was 1.8 × 10 5 . Although more experimental research is needed to identify the underlying mechanisms, pulsed plasma is perceived as being a smart alternative to investigate the error structure in FPGA.

Item Type: Article
Uncontrolled Keywords: Plasmas, Ions, Switches, X-rays, Acceleration, Electrodes, Capacitors
Subjects: Q Science > QC Physics
Divisions: Centre for Plasma Research
Depositing User: Unnamed user with email
Date Deposited: 11 Dec 2019 03:01
Last Modified: 11 Dec 2019 03:01

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