Study of Structural Properties of Ni3Pb2S2 Films

Ho, Soon Min (2017) Study of Structural Properties of Ni3Pb2S2 Films. ORIENTAL JOURNAL OF CHEMISTRY, 33 (4). pp. 2134-2137. ISSN 0970-020 X

study of structural properties of Ni3Pb2S2 films.pdf

Download (552kB) | Preview


In this work, X-ray diffraction technique was applied to determine the structure of nickel lead sulphide thin films prepared by chemical bath deposition. The X-ray diffraction patterns reflect that polycrystalline Ni3Pb2S2 could be obtained using the method explained. The XRD data show that an increasing the deposition time from 7 to 30 hours resulted in increase in the number of peaks.

Item Type: Article
Subjects: Q Science > QD Chemistry
Divisions: Faculty of Engineering, Science and Mathematics > School of IT
Depositing User: Unnamed user with email
Date Deposited: 18 Sep 2018 01:55
Last Modified: 18 Sep 2018 01:56

Actions (login required)

View Item View Item