Ho, Soon Min (2017) Study of Structural Properties of Ni3Pb2S2 Films. ORIENTAL JOURNAL OF CHEMISTRY, 33 (4). pp. 2134-2137. ISSN 0970-020 X
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Abstract
In this work, X-ray diffraction technique was applied to determine the structure of nickel lead sulphide thin films prepared by chemical bath deposition. The X-ray diffraction patterns reflect that polycrystalline Ni3Pb2S2 could be obtained using the method explained. The XRD data show that an increasing the deposition time from 7 to 30 hours resulted in increase in the number of peaks.
| Item Type: | Article |
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| Subjects: | Q Science > QD Chemistry |
| Divisions: | Faculty of Engineering, Science and Mathematics > School of IT |
| Depositing User: | Unnamed user with email masilah.mansor@newinti.edu.my |
| Date Deposited: | 18 Sep 2018 01:55 |
| Last Modified: | 18 Sep 2018 01:56 |
| URI: | http://eprints.intimal.edu.my/id/eprint/1079 |
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