Real-Time Fault Detection in Microcontrollers
DOI:
https://doi.org/10.61453/INTIj.20260227Keywords:
Fault detection, Microcontroller, Error detection, Error diagnosis, Image processingAbstract
The innovation demonstrates an automated system of faults in microcontrollers detection and diagnostics and provides prolonged assistance in the production line testing and maintenance. Its usage encompasses a range of microcontroller systems that make use of several units, in which substitution of entire boards create electronic waste. It will assist with an ESP32 CAM module to capture the image of the microcontroller to compare it with the test images stored on SD cards and perform physical fault checks. In case of success and a pulse is transmitted to Arduino UNO, which also checks the controller with logical errors. The UNO has a few other tests such as pin input/output and timer functions, the results of which are displayed on the Serial Monitor of the Arduino IDE. These two processes are to be integrated. Integration of these two processes not only streamlines the fault detection processes, but it promotes sustainability instead of replacing whole boards by reducing e-waste. This innovation has a higher potential to provide significant advancement in microcontroller fault detection technology and drive efficiency in electronic system management.
References
Buturuga, A., Constantinescu, R., & Stoichescu, D. (2017). Time measurement techniques for microcontroller performance analysis. 2017 IEEE 23rd International Symposium for Design and Technology in Electronic Packaging (SIITME), 38–43. https://doi.org/10.1109/SIITME.2017.8259853
Elshafey, K., & Elhosiny, A. (2006). On-line testing and diagnosis of microcontroller. 2006 International Conference on Microelectronics, 178–181. https://doi.org/10.1109/ICM.2006.373296
Nikam, P., & Sawant, S. D. (2017). Circuit board defect detection using image processing and microcontroller. 2017 International Conference on Inventive Communication and Computational Technologies (ICCONS), 1096–1098. https://doi.org/10.1109/ICCONS.2017.8250635
Pankov, D., & Denisova, L. (2019). Automated testing and fault diagnosis of the microcontroller system. IOP Conference Series: Materials Science and Engineering, 537(2), Article 022072. https://doi.org/10.1088/1757-899X/537/2/022072
Rieder, B. (2020). Engines of order: A mechanology of algorithmic techniques. Amsterdam University Press. [Book]
Shih, M. Y., Shishido, A., & Khoo, I. C. (2001). All-optical image processing by means of a photosensitive nonlinear liquid-crystal film: Edge enhancement and image addition-subtraction. Optics Letters, 26(15), 1140–1142. https://doi.org/10.1364/OL.26.001140
Downloads
Published
How to Cite
Issue
Section
License
Copyright (c) 2026 INTI Journal

This work is licensed under a Creative Commons Attribution 4.0 International License.